Thermal management, electronics cooling and reliability
Thermal transient testing • Thermal simulation • CFD simulation • Compact thermal modelling • Thermal reliability • Integrated microchannel cooling
Kerecsenné Rencz Márta
professzor emerita
QB328
(+36) 1 463-2727
Poppe András
full professor
QB326
(+36) 1 463-2721
A kutatócsoport tagjai:
Kerecsenné Rencz Márta
professzor emerita
Poppe András
full professor
Bognár György
associate professor
Farkas Gábor
honorary associate professor
Pohl László
associate professor
Szabó Péter Gábor
associate professor
Takács Gábor
assistant professor
Hantos Gusztáv
assistant lecturer
Hegedüs János
assistant research fellow
Kohári Zsolt
assistant research fellow
Jani Lázár
assistant professor
Ress Sándor László
associate professor
Horváth Péter
assistant professor
Timár András
assistant professor
Németh Márton
research fellow
Activity of the research group:
Measurement, modelling and simulation of the thermal properties of semiconductor devices, modules and systems, development and testing of new integrated cooling solutions, reliability studies of semiconductor devices using thermal transient measurement and structure function analysis.
Recent results:
- Development of a thermal reliability test method for power semiconductors using structure functions recorded during power cycling
- Development of a method for measuring the thermal conductivity of thermal interface materials
- Novel thermal measurements of power semiconductors (e.g. IGBTs)
- Development of methods for real thermal resistance measurements of LED packages, compact thermal modelling, development of relevant JEDEC measurement standards
- Development and characterisation of microchannel integrated cooling solutions by thermal transient measurements and numerical simulations
- Development of log-thermal simulation methods to investigate the thermal properties of digital integrated circuits at different levels of circuit abstraction (cell, RTL, system)
- Development of finite volume numerical simulation algorithms, development of ROM algorithms for thermal simulations
- Modelling and characterisation of MEMS devices operating on electrothermal principles
- Investigation of thermal phenomena during heterogeneous integration and development of cooling solutions
Special infrastructure:
T3Ster (classic) thermal transient tester • HV booster for T3Ster • TeraLED accessory for combined thermal and radiometric/photometric LED measurements for T3Ster, 30 cm integrating sphere (with Pletier element cold plate) • TeraLED accessory for T3Ster instrument for combined thermal and radiometric/photometric LED measurements, 50 cm integrating sphere (with Pletier element and liquid cold plate) • Julabo thermostat • WEISS climatic chamber (1-2m3)
Recent projects:
NKFIH K_20 135224 Novel solutions to thermal problems in chiplet-based System-on-Package devices • OTKA 109232 Integrated thermal management in System-on-Package devices • AI-TWILIGHT H2020 ECSEL • Delphi4LED H2020 ECSEL
International relations:
TU Chemnitz • Thales Research
Industrial partners:
Mentor, UK • Infineon • HungaroLux Light Kft